CLTE vs Moisture Absorption

When designing precision applications for semiconductor manufacturing environments, understanding dimensional stability is critical. Two key factors influence how plastic materials behave in these demanding conditions: Moisture Absorption and the Coefficient of Linear Thermal Expansion (CLTE). But which property has the greater impact on your finished application?
Understanding Moisture Absorption in Engineering Plastics
Moisture Absorption measures the weight gain of a plastic specimen both during short-term immersion (24 hours) and at full saturation, following ASTM D590 testing standards. This property is crucial for understanding how materials behave in humid or wet environments common in semiconductor fabrication facilities.
How Moisture Absorption Works
For most engineering plastics, moisture exists in a free state within nano-sized pockets throughout the polymer matrix. While 24-hour immersion testing provides valuable data about the rate of absorption, saturation levels primarily apply to applications that will exist in continuously saturated environments—a relatively rare scenario in most semiconductor applications.
Key Insight: Practical Moisture Absorption
The practical moisture absorption of a specific plastic material depends on reaching equilibrium within its actual operating environment. A material will not reach full saturation unless it is completely immersed in liquid—a condition that rarely occurs in semiconductor tooling and fixtures.
The Coefficient of Linear Thermal Expansion (CLTE) Explained
CLTE is a measure of the change in length of a plastic material per unit temperature change. This coefficient quantifies how much a material expands or contracts as temperature fluctuates—a critical consideration in precision semiconductor equipment where tolerances are measured in microns.
Material-Specific Coefficients
Every engineering plastic material has its own unique CLTE coefficient that engineers can use to calculate expected dimensional changes over specific temperature ranges. For engineering plastic materials used in semiconductor applications, the standard test range spans from -30°F to 300°F (-34°C to 149°C), covering the extreme conditions these materials may encounter.
Technical Note: CLTE is typically expressed in units of in/in/°F (inches per inch per degree Fahrenheit) or mm/mm/°C (millimeters per millimeter per degree Celsius). This ratio allows engineers to calculate dimensional changes for components of any size.
The Great Race: CLTE vs Moisture Absorption
The critical question for engineers designing semiconductor tooling and fixtures is: Which property has a larger impact on material growth and dimensional stability?
Real-World Testing with PEEK
To answer this question definitively, Port Plastics conducted comparative testing using PEEK (Polyetheretherketone), one of the most common high-performance polymers in semiconductor applications. The results were striking and may surprise many engineers.
Test Parameters and Results
- Test Sample: 50mm PEEK bar
- CLTE Value: 2.6 × 10⁻⁵ in/in/°F
- Temperature Range: 0°F to 150°F (83°C range)
- Moisture Saturation Value: 0.5%
- Moisture Test: Completely dry to full saturation
The Winner: CLTE by a Factor of Nearly 7X
- ? Growth from CLTE (0°F to 150°F): 0.20mm
- ? Growth from Moisture (dry to saturation): 0.03mm
- ? Impact Ratio: CLTE has ~6.7× more impact than moisture absorption
Dimensional Changes Across the Length of Material
Understanding how dimensional changes accumulate across the length of a component is essential for precision applications. The following data shows calculated movement at 10mm increments along the 50mm PEEK test bar due to CLTE, compared to the total moisture absorption impact:
CLTE vs Moisture Absorption for PEEK (0°F to 150°F)
Total Length: 50mm Test Specimen
| Position | Cumulative CLTE Growth |
|---|---|
| 1mm | +0.004mm |
| 10mm | +0.04mm |
| 20mm | +0.08mm |
| 30mm | +0.12mm |
| 40mm | +0.16mm |
| 50mm (Total) | +0.20mm (CLTE) |
|
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